| Автор | Ö Faruk Yüksel |
| Автор | Haluk Şafak |
| Автор | Mehmet Şahin |
| Автор | Bülent M Başol |
| Дата выпуска | 2005-01-01 |
| dc.description | Thin film CuInSe<sub>2</sub> chalcopyrite semiconductors have been prepared on glass substrates by means of two-stage process. The structural properties and atomic compositions of films were determined by energy-dispersive analysis of x-rays (EDAX) and x-ray diffraction (XRD) measurements. Reflectance and transmittance measurements were performed on the films in the photon wavelength range of 300–2200 nm. The samples used in the measurements have different Cu/In ratios. The reflectance and transmittance spectra were analyzed on the basis of multiple reflection model considering the absorbing film on a non-absorbing substrate and then complex refractive-index n*(E) = n(E) + ik(E) and complex dielectric constant ε*(E) = ε<sub>1</sub>(E) + iε<sub>2</sub>(E) were determined. It has been concluded that the films having higher Cu/In ratios show stronger absorption at low photon energy region than those having lower Cu/In ratios. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | Optical Constants of CuInSe<sub>2</sub> Thin Films Prepared by Two-Stage Process |
| Тип | paper |
| DOI | 10.1238/Physica.Regular.071a00221 |
| Electronic ISSN | 1402-4896 |
| Print ISSN | 0031-8949 |
| Журнал | Physica Scripta |
| Том | 71 |
| Первая страница | 221 |
| Последняя страница | 224 |
| Выпуск | 2 |
