Автор |
Hattrick-Simpers, Jason R |
Автор |
Tan, Zhuopeng |
Автор |
Oguchi, Hiroyuki |
Автор |
Chiu, Chun |
Автор |
Heilweil, Edwin J |
Автор |
Maslar, James E |
Автор |
Bendersky, Leonid A |
Дата выпуска |
2011-10-01 |
dc.description |
In order to increase measurement throughput, a characterization scheme has been developed that accurately measures the hydrogen storage properties of materials in quantities ranging from 10 ng to 1 g. Initial identification of promising materials is realized by rapidly screening thin-film composition spread and thickness wedge samples using normalized IR emissivity imaging. The hydrogen storage properties of promising samples are confirmed through measurements on single-composition films with high-sensitivity (resolution <0.3 μg) Sievert's-type apparatus. For selected samples, larger quantities of up to ∼100 mg may be prepared and their (de)hydrogenation and micro-structural properties probed via parallel in situ Raman spectroscopy. Final confirmation of the hydrogen storage properties is obtained on ∼1 g powder samples using a combined Raman spectroscopy/Sievert's apparatus. |
Формат |
application.pdf |
Издатель |
Institute of Physics Publishing |
Копирайт |
2011 National Institute for Materials Science |
Название |
A combinatorial characterization scheme for high-throughput investigations of hydrogen storage materials |
Тип |
paper |
DOI |
10.1088/1468-6996/12/5/054207 |
Electronic ISSN |
1878-5514 |
Print ISSN |
1468-6996 |
Журнал |
Science and Technology of Advanced Materials |
Том |
12 |
Первая страница |
54207 |
Последняя страница |
54212 |
Аффилиация |
Hattrick-Simpers, Jason R; Materials Science and Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA |
Аффилиация |
Tan, Zhuopeng; Department of Materials Science and Engineering, University of Maryland, College Park, MD 20742, USA |
Аффилиация |
Oguchi, Hiroyuki; Institute for Materials Research, Tohoku University, Sendai 980 8577, Japan |
Аффилиация |
Chiu, Chun; Materials Science and Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA |
Аффилиация |
Heilweil, Edwin J; Physics Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA |
Аффилиация |
Maslar, James E; Chemicals Science and Technology Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA |
Аффилиация |
Bendersky, Leonid A; Materials Science and Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA |
Выпуск |
5 |