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Автор Sasaki, Takeo
Автор Matsunaga, Katsuyuki
Автор Ohta, Hiromichi
Автор Hosono, Hideo
Автор Yamamoto, Takahisa
Автор Ikuhara, Yuichi
Дата выпуска 2003-11-30
dc.description Interfacial atomic structures of Cu/Al<sub>2</sub>O<sub>3</sub>(0001) and Cu/Al<sub>2</sub>O<sub>3</sub>(112̅0) systems prepared by a pulsed-laser deposition technique have been characterized by using high-resolution transmission electron microscopy (HRTEM). It was found that Cu metals were epitaxially oriented to the surface of Al<sub>2</sub>O<sub>3</sub> substrates, and the following orientation relationships (ORs) were found to be formed: (111)<sub>Cu</sub>//(0001)Al<sub>2</sub>O<sub>3</sub>, [11̅0]<sub>Cu</sub>//[11̅00]Al<sub>2</sub>O<sub>3</sub> in the Cu/Al<sub>2</sub>O<sub>3</sub>(0001) interface and (001)<sub>Cu</sub>//(112̅0)Al<sub>2</sub>O<sub>3</sub>, [11̅0]<sub>Cu</sub>//[0001]Al<sub>2</sub>O<sub>3</sub> in the Cu/Al<sub>2</sub>O<sub>3</sub>(112̅0) interface. Geometrical coherency of the Cu/Al<sub>2</sub>O<sub>3</sub> system has been evaluated by the coincidence of reciprocal lattice points method, and the result showed that the most coherent ORs were (111)<sub>Cu</sub>//(0001)Al<sub>2</sub>O<sub>3</sub>, [112̅]<sub>Cu</sub>//[11̅00]Al<sub>2</sub>O<sub>3</sub> and (11̅0)<sub>Cu</sub>//(112̅0)Al<sub>2</sub>O<sub>3</sub>, [111]<sub>Cu</sub>//[0001]Al<sub>2</sub>O<sub>3</sub>, which are equivalent to each other. These ORs were not consistent with the experimentally observed ORs, and it was possible that crucial factors to determine the ORs between Cu and Al<sub>2</sub>O<sub>3</sub> were not only geometrical coherency, but also other factors such as chemical bonding states. Therefore, to understand the nature of the interface atomic structures, the electronic structures of the Cu/Al<sub>2</sub>O<sub>3</sub> interfaces have been investigated by electron energy-loss spectroscopy. It was found that the pre-edge at the lower energy part of the main peak appeared in the O-K edge spectra at the interface region in both the Cu/Al<sub>2</sub>O<sub>3</sub>(0001) and Cu/Al<sub>2</sub>O<sub>3</sub>(112̅0) systems. This indicates the existence of Cu–O interactions at the interface. In fact, HRTEM simulation images based on O-terminated interface models agreed well with the experimental images, indicating that O-terminated interfaces were formed in both systems. Since the overlapped Cu atomic density in the experimental ORs were larger than that in the most coherent OR, it is considered that the on-top Cu–O bonds stabilize the O-terminated Cu/Al<sub>2</sub>O<sub>3</sub> interfaces.
Формат application.pdf
Издатель Institute of Physics Publishing
Копирайт © 2004 Elsevier Science Ltd
Название Atomic and electronic structures of Cu/α-Al<sub>2</sub>O<sub>3</sub> interfaces prepared by pulsed-laser deposition
Тип paper
DOI 10.1016/j.stam.2003.12.003
Electronic ISSN 1878-5514
Print ISSN 1468-6996
Журнал Science and Technology of Advanced Materials
Том 4
Первая страница 575
Последняя страница 584
Аффилиация Sasaki, Takeo; Department of Materials Engineering, School of Engineering, The University of Tokyo, 2-11-16 Yayoi, Bunkyo-ku, Tokyo 113-8656, Japan
Аффилиация Matsunaga, Katsuyuki; Institute of Engineering Innovation, School of Engineering, The University of Tokyo, 2-11-16 Yayoi, Bunkyo-ku, Tokyo 113-8656, Japan
Аффилиация Ohta, Hiromichi; Hosono Transparent ElectroActive Materials, ERATO, Japan Science and Technology Corporation, KSP C-1232, 3-2-1 Sakado, Takatsu-ku, Kawasaki 213-0012, Japan
Аффилиация Hosono, Hideo; Materials and Structures Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan
Аффилиация Yamamoto, Takahisa; Department of Advanced Materials Science, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656, Japan
Аффилиация Ikuhara, Yuichi; Institute of Engineering Innovation, School of Engineering, The University of Tokyo, 2-11-16 Yayoi, Bunkyo-ku, Tokyo 113-8656, Japan;
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