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Автор Tsurumi, Takaaki
Автор Harigai, Takakiyo
Автор Tanaka, Daisuke
Автор Kakemoto, Hirofumi
Автор Wada, Satoshi
Дата выпуска 2004-07-31
dc.description Perovskite-type BaTiO<sub>3</sub>/SrTiO<sub>3</sub> (BTO/STO) artificial superlattices were fabricated by molecular beam epitaxy process and their dielectric properties and refractive indices were measured. A large leakage current was observed in the films on Nb-doped STO substrate. Dielectric permittivity was therefore measured using planer interdigital electrodes. Fine planer electrodes were necessary to reduce the penetration of electric flux into the substrate. Interdigital electrodes were formed by electron-beam lithography. Dielectric permittivity of superlattices along the film surface was determined using electromagnetic field analysis. It was found that the dielectric permittivity of the BTO/STO superlattice with the period of 10 unit cells showed a maximum value above 30,000, which was almost independent from frequency up to 110 MHz. The refractive index of superlattices measured with a spectroscopic ellipsometer also showed the highest value when the period was 10 unit cells. This indicated that the structure of superlattices affected not only the ionic polarization but also the electric polarization. The origin of anomalous properties observed in superlattices may be interpreted by the strains induced into the film.
Формат application.pdf
Издатель Institute of Physics Publishing
Копирайт © 2004 Elsevier Ltd
Название Anomalous dielectric and optical properties in perovskite-type artificial superlattices
Тип paper
DOI 10.1016/j.stam.2004.01.021
Electronic ISSN 1878-5514
Print ISSN 1468-6996
Журнал Science and Technology of Advanced Materials
Том 5
Первая страница 425
Последняя страница 429
Аффилиация Tsurumi, Takaaki;
Аффилиация Harigai, Takakiyo; Graduate School of Science and Engineering, Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro, Tokyo 152-8552, Japan
Аффилиация Tanaka, Daisuke; Graduate School of Science and Engineering, Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro, Tokyo 152-8552, Japan
Аффилиация Kakemoto, Hirofumi; Graduate School of Science and Engineering, Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro, Tokyo 152-8552, Japan
Аффилиация Wada, Satoshi; Graduate School of Science and Engineering, Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro, Tokyo 152-8552, Japan
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