| Автор | H Ohashi |
| Автор | S Suda |
| Автор | H Tanuma |
| Автор | S Fujioka |
| Автор | H Nishimura |
| Автор | K Nishihara |
| Автор | T Kai |
| Автор | A Sasaki |
| Автор | H A Sakaue |
| Автор | N Nakamura |
| Автор | S Ohtani |
| Дата выпуска | 2009-04-01 |
| dc.description | Extreme ultra-violet (EUV) emission spectra of multiply charged tin ions were measured in the wavelength range of 10-22 nm following charge exchange collisions of Sn<sup>q+</sup>(q 15-21) ions with rare gas targets at 20 keV/q or the electron impact excitation of tin ions with electron energy of 312-613 eV. In charge exchange collisions, we observed both the resonance lines and the emission lines corresponding to the transitions between the excited states. On the other hand, we observed mainly the resonance lines in the electron impact experiments. We can distinguish the resonance lines from other emission lines in the charge exchange spectrum by comparison with the emission lines in the electron impact spectrum. The comparison of the complementary experimental results can be regarded as a new method of spectroscopy of multiply charged ions. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Копирайт | © 2009 IOP Publishing Ltd |
| Название | Complementary spectroscopy of tin ions using ion and electron beams |
| Тип | paper |
| DOI | 10.1088/1742-6596/163/1/012071 |
| Electronic ISSN | 1742-6596 |
| Print ISSN | 1742-6588 |
| Журнал | Journal of Physics: Conference Series |
| Том | 163 |
| Первая страница | 12071 |
| Последняя страница | 12074 |
| Выпуск | 1 |
