| Автор | B R Yates |
| Автор | K Keane |
| Автор | M A Khakoo |
| Дата выпуска | 2009-11-01 |
| dc.description | Doubly differential cross-sections for the single electron impact ionization of Ne and Xe have been measured at several energies below the second ionization energy. The results indicate that the ionization of Ne is strongly influenced by the polarization of the ionized 2<sup>2</sup>P<sub>3/2,1/2</sub> core, where as this influence is significantly reduced for Xe. Single differential cross-sections are derived from the doubly differential cross-sections and for Xenon these show profiles similar to Helium ("smile"), whereas for Neon they show a dissimilar profile ("frown"). |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Копирайт | © 2009 IOP Publishing Ltd |
| Название | Near-threshold electron impact ionization of Ne and Xe |
| Тип | paper |
| DOI | 10.1088/1742-6596/194/5/052001 |
| Electronic ISSN | 1742-6596 |
| Print ISSN | 1742-6588 |
| Журнал | Journal of Physics: Conference Series |
| Том | 194 |
| Первая страница | 52001 |
| Последняя страница | 52001 |
| Выпуск | 5 |
