Self-assembly growth and structure study of BiFeO<sub>3</sub>-CoFe<sub>2</sub>O<sub>4</sub> nanostructure film
Q Song; X Y Zhang; C K Ong
Журнал:
Journal of Physics: Conference Series
Дата:
2010-01-01
Аннотация:
Pulsed laser deposition method was used to prepare (0.67) BiFeO<sub>3</sub>- (0.33) CoFe<sub>2</sub>O<sub>4</sub> nanostructure thin film. The XRD analysis shows that lower growth temperature will not obtain separation of BiFeO<sub>3</sub> and CoFe<sub>2</sub>O<sub>4</sub> phase. Post-annealing treatment will induce the phase separation. XRD data and SEM image both confirm these phase separation.
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