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Автор V A Andrianov
Автор L V Filippenko
Автор V P Gorkov
Автор V P Koshelets
Дата выпуска 2006-06-01
dc.description Superconducting tunnel junction X-rays detectors Ti/Nb/Al/AlO<sub>x</sub>/Al/Nb/NbN with the Ti/Nb/Al/ killed electrode were studied under irradiation by X-rays photons of different energies produced by the fluorescence method. The nonlinearity of the detector response and the shape of the detector line were analyzed on the basis of the diffusion model taking into account the quasiparticle self-recombination and edge losses.
Формат application.pdf
Издатель Institute of Physics Publishing
Копирайт © 2006 IOP Publishing Ltd
Название Recombination losses in STJ X-ray detectors with killed electrode
Тип paper
DOI 10.1088/1742-6596/43/1/320
Electronic ISSN 1742-6596
Print ISSN 1742-6588
Журнал Journal of Physics: Conference Series
Том 43
Первая страница 1311
Последняя страница 1314
Выпуск 1

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