| Автор | Petr Klapetek |
| Автор | Jirí Burík |
| Дата выпуска | 2007-03-01 |
| dc.description | In this article results of complete modelling of electromagnetic field distribution in a near-field scanning probe microscope (NSOM) are presented. It is shown, that using finite difference in time domain method the NSOM signal can be computed for real tip-sample geometry. The results of such a simulation can be used to predict presence and distribution of topography related artefacts in NSOM images. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Копирайт | © 2007 IOP Publishing Ltd |
| Название | Artefacts in Near-Field Optical Microscopy |
| Тип | paper |
| DOI | 10.1088/1742-6596/61/1/115 |
| Electronic ISSN | 1742-6596 |
| Print ISSN | 1742-6588 |
| Журнал | Journal of Physics: Conference Series |
| Том | 61 |
| Первая страница | 570 |
| Последняя страница | 575 |
| Аффилиация | Petr Klapetek; Czech Metrology Institute, Okruzní 31, 638 00 Brno, Czech Republic; Institute of Physics of Materials, ASCR, izkova 22, 61662 Brno, Czech Republic |
| Аффилиация | Jirí Burík; Czech Metrology Institute, Okruzní 31, 638 00 Brno, Czech Republic; Institute of Physics of Materials, ASCR, izkova 22, 61662 Brno, Czech Republic |
| Выпуск | 1 |
