Operation of a Thick Gas Electron Multiplier (THGEM) in Ar, Xe and Ar-Xe
R Alon; J Miyamoto; M Cortesi; A Breskin; R Chechik; I Carne; J M Maia; J M F dos Santos; M Gai; D McKinsey; V Dangendorf
Журнал:
Journal of Instrumentation
Дата:
2008-01-01
Аннотация:
We present the results of our recent studies of a Thick Gaseous Electron Multiplier (THGEM)-based detector, operated in Ar, Xe and Ar:Xe (95:5) at various gas pressures. Avalanche-multiplication properties and energy resolution were investigated with soft x-rays for different detector configurations and parameters. Gains above 10<sup>4</sup> were reached in a double-THGEM detector, at atmospheric pressure, in all gases, in almost all the tested conditions; in Ar:Xe (95:5) similar gains were reached at pressures up to 2 bar. The energy resolution dependence on the gas, pressure, hole geometry and electric fields was studied in detail, yielding in some configurations values below 20% FWHM with 5.9 keV x-rays.
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