The electromagnetic response of different metamaterial structures
Vu, Dinh Lam; Pham, Van Tuong; Do, Thanh Viet; Nguyen, Thanh Tung; Vu, Tran Thanh Thuy; Le, Van Hong; Lee, Young Pak; Vu, Dinh Lam; Institute of Materials Science, Vietnam Academy of Science and Technology, Vietnam; Pham, Van Tuong; Institute of Materials Science, Vietnam Academy of Science and Technology, Vietnam; Do, Thanh Viet; Institute of Engineering Physics, Vietnamese Military Academy of Science and Technology, Vietnam; Nguyen, Thanh Tung; Institute of Engineering Physics, Vietnamese Military Academy of Science and Technology, Vietnam; Vu, Tran Thanh Thuy; q-Psi and Department of Physics, Hanyang University, Seoul 133-791, Korea; Le, Van Hong; Institute of Materials Science, Vietnam Academy of Science and Technology, Vietnam; Lee, Young Pak; q-Psi and Department of Physics, Hanyang University, Seoul 133-791, Korea
Журнал:
Advances in Natural Sciences: Nanoscience and Nanotechnology
Дата:
2010-12-01
Аннотация:
This report investigates systematically the effect of structural parameters on the left-handed behavior of a combined structure. The combined structure consists of a ‘cut-wire pair’, providing a negative magnetic permeability μ<0, and a ‘continuous wire’, yielding a negative electric permittivity ε<0. The left-handed metamaterials were designed, fabricated and measured in the microwave-frequency regime. It was found that the width of the continuous wire as well as the distance between the substructures play an important role in determining whether negative refractive properties (in other words, left-handed behavior) are obtained or not. Additionally, we studied the influence of the lattice constant on the electromagnetic response of the combined structure. The actual measurements are compared with numerical simulation values to show good coincidence. Finally, we designed and simulated an electromagnetic absorber made of metamaterials. It is expected that this work will allow us to optimize appropriate characteristic parameters even without avoiding trial and error fabrications.
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