Showing items related by title, author, creator and subject.

• Efficiency, stress drop, apparent stress, effective stress, and frictional stress of Denver, Colorado, earthquakes

  Wyss, Max; Molnar, Peter (1972)
• Degradation and lifetime estimation of n-MOS SLS ELA polycrystalline TFTs during hot carrier stressing: effect of channel width in the region V_th ⩽ V_GS,stress ⩽ V_DS,stress/2

  Kontogiannopoulos, G P; Farmakis, F V; Kouvatsos, D N; Papaioannou, G J; Voutsas, A T; Kontogiannopoulos, G P; Institute of Microelectronics, NCSR Demokritos, Aghia Paraskevi 15310, Greece; Farmakis, F V; Institute of Microelectronics, NCSR Demokritos, Aghia Paraskevi 15310, Greece; Kouvatsos, D N; Institute of Microelectronics, NCSR Demokritos, Aghia Paraskevi 15310, Greece; Papaioannou, G J; Physics Department, University of Athens, Athens 157 84, Greece; Voutsas, A T; Material and Device Applications Laboratory, Sharp Labs of America, 5700 NM Pacific Rim Blvd, Camas, WA 98607, USA (Institute of Physics Publishing, 2009-07-01)
• The Determination of the Separate Stresses in Three-dimensional Stress Investigations by the Frozen Stress Method

  H T Jessop; H T Jessop; Photoelastic Laboratory, University College, London (Institute of Physics Publishing, 1949-01-01)