| Автор | Lubarda, Vlado, A. |
| Дата выпуска | 1998 |
| dc.description | The relationship between the film thickness and dislocation spacing in the interface dislocation arrays is studied by using a criterion based on the energy difference between the relaxed film configuration and a selected, partially relaxed or unrelaxed reference configuration. It is shown that arrays with lower dislocation density are formed in relaxation processes that are more gradual. Stability of arrays is examined, and new bounds of the stable range are constructed. |
| Издатель | Sage Publications |
| Название | Dislocation Arrays at the Interface between an Epitaxial Layer and Its Substrate |
| Тип | Journal Article |
| DOI | 10.1177/108128659800300403 |
| Print ISSN | 1081-2865 |
| Журнал | Mathematics and Mechanics of Solids |
| Том | 3 |
| Первая страница | 411 |
| Последняя страница | 431 |
| Аффилиация | Lubarda, Vlado, A., Department of Applied Mechanics and Engineering Sciences, University of California, San Diego, CA 92093-0411 |
| Выпуск | 4 |
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| Библиографическая ссылка | [17] Lubarda, V. A.: Energy analysis of dislocation arrays near bimaterial interfaces. Int. J. Solids Struct., 34, 1053-1073 (1997). |
