LOW-ENERGY ELECTRON MICROSCOPY OF SURFACE PHASE TRANSITIONS
Hannon, James B.; Tromp, Ruud M.; Hannon, James B.; IBM Research Division, T.J. Watson Research Center, Yorktown Heights, New York 10598; email: jbhannon@us.ibm.com
Журнал:
Annual Review of Materials Research
Дата:
2003
Аннотация:
▪ Abstract The use of low-energy electron microscopy (LEEM) to study reversible surface phase transitions is reviewed. Representative experiments are described that highlight the key advantages of LEEM: the ability to image surfaces in situ, at elevated temperature, with good spatial and temporal resolution. With these capabilities, the evolution of individual surface features—domains, facets, islands, steps, etc.—can be measured. Real-time and real-space imaging make LEEM a powerful tool for characterizing the thermodynamics and kinetics that govern surface phase transformations.
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