| Автор | Hannon, James B. |
| Автор | Tromp, Ruud M. |
| Дата выпуска | 2003 |
| dc.description | ▪ Abstract The use of low-energy electron microscopy (LEEM) to study reversible surface phase transitions is reviewed. Representative experiments are described that highlight the key advantages of LEEM: the ability to image surfaces in situ, at elevated temperature, with good spatial and temporal resolution. With these capabilities, the evolution of individual surface features—domains, facets, islands, steps, etc.—can be measured. Real-time and real-space imaging make LEEM a powerful tool for characterizing the thermodynamics and kinetics that govern surface phase transformations. |
| Формат | application.pdf |
| Издатель | Annual Reviews |
| Копирайт | Annual Reviews |
| Название | LOW-ENERGY ELECTRON MICROSCOPY OF SURFACE PHASE TRANSITIONS |
| DOI | 10.1146/annurev.matsci.33.121901.111743 |
| Print ISSN | 1531-7331 |
| Журнал | Annual Review of Materials Research |
| Том | 33 |
| Первая страница | 263 |
| Последняя страница | 288 |
| Аффилиация | Hannon, James B.; IBM Research Division, T.J. Watson Research Center, Yorktown Heights, New York 10598; email: jbhannon@us.ibm.com |
