Determination of small fluctuations in electron density profiles of thin films: Layer formation in a polystyrene film
M. K. Sanyal; J. K. Basu; A. Datta; S. Banerjee; M. K. Sanyal; Saha Institute of Nuclear Physics - 1/AF, Bidhannagar, Calcutta-700 064, India; J. K. Basu; Saha Institute of Nuclear Physics - 1/AF, Bidhannagar, Calcutta-700 064, India; A. Datta; Saha Institute of Nuclear Physics - 1/AF, Bidhannagar, Calcutta-700 064, India; S. Banerjee; Saha Institute of Nuclear Physics - 1/AF, Bidhannagar, Calcutta-700 064, India
Журнал:
EPL (Europhysics Letters)
Дата:
1996-11-01
Аннотация:
A spin-coated thin polystyrene film on a silicon single crystal has been studied using the X-ray reflectivity technique. Signature of layering as a function of depth, due to confinement, in this polystyrene film could be detected from the reflectivity profile using a new analysis scheme. Small variations of electron density across the depth of a thin film can be determined from reflectivity data using this scheme with no a priori distribution of electron density profile.
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