| Автор | M. K. Sanyal |
| Автор | J. K. Basu |
| Автор | A. Datta |
| Автор | S. Banerjee |
| Дата выпуска | 1996-11-01 |
| dc.description | A spin-coated thin polystyrene film on a silicon single crystal has been studied using the X-ray reflectivity technique. Signature of layering as a function of depth, due to confinement, in this polystyrene film could be detected from the reflectivity profile using a new analysis scheme. Small variations of electron density across the depth of a thin film can be determined from reflectivity data using this scheme with no a priori distribution of electron density profile. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Копирайт | 1996 EDP Sciences |
| Название | Determination of small fluctuations in electron density profiles of thin films: Layer formation in a polystyrene film |
| Тип | lett |
| DOI | 10.1209/epl/i1996-00220-2 |
| Electronic ISSN | 1286-4854 |
| Print ISSN | 0295-5075 |
| Журнал | EPL (Europhysics Letters) |
| Том | 36 |
| Первая страница | 265 |
| Последняя страница | 270 |
| Аффилиация | M. K. Sanyal; Saha Institute of Nuclear Physics - 1/AF, Bidhannagar, Calcutta-700 064, India |
| Аффилиация | J. K. Basu; Saha Institute of Nuclear Physics - 1/AF, Bidhannagar, Calcutta-700 064, India |
| Аффилиация | A. Datta; Saha Institute of Nuclear Physics - 1/AF, Bidhannagar, Calcutta-700 064, India |
| Аффилиация | S. Banerjee; Saha Institute of Nuclear Physics - 1/AF, Bidhannagar, Calcutta-700 064, India |
| Выпуск | 4 |
