Two-layer behaviour during low-energy ion ablation of CdTe(001) studied by in situ X-ray diffraction and by Monte Carlo simulation
V. H. Etgens; R. M. Ribeiro-Teixeira; P. M. Mors; M. B. Veron; S. Tatarenko; M. Sauvage-Simkin; J. Alvarez; S. Ferrer
Журнал:
EPL (Europhysics Letters)
Дата:
1996-11-01
Аннотация:
The evolution of the CdTe(001) surface during ion bombardment was studied by grazing incidence X-ray diffraction (GIXD) and by Monte Carlo simulation. A layer-by-layer removal was observed at 270 °C which evolves to a step-flow mode above 300 °C. An anisotropic relaxation of the surface lattice parameter and a long-distance correlation between islands along the [1 − 1 0] direction were observed during sputtering.
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