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Автор V. H. Etgens
Автор R. M. Ribeiro-Teixeira
Автор P. M. Mors
Автор M. B. Veron
Автор S. Tatarenko
Автор M. Sauvage-Simkin
Автор J. Alvarez
Автор S. Ferrer
Дата выпуска 1996-11-01
dc.description The evolution of the CdTe(001) surface during ion bombardment was studied by grazing incidence X-ray diffraction (GIXD) and by Monte Carlo simulation. A layer-by-layer removal was observed at 270 °C which evolves to a step-flow mode above 300 °C. An anisotropic relaxation of the surface lattice parameter and a long-distance correlation between islands along the [1 − 1 0] direction were observed during sputtering.
Формат application.pdf
Издатель Institute of Physics Publishing
Копирайт 1996 EDP Sciences
Название Two-layer behaviour during low-energy ion ablation of CdTe(001) studied by in situ X-ray diffraction and by Monte Carlo simulation
Тип lett
DOI 10.1209/epl/i1996-00221-7
Electronic ISSN 1286-4854
Print ISSN 0295-5075
Журнал EPL (Europhysics Letters)
Том 36
Первая страница 271
Последняя страница 276
Выпуск 4

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