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Автор R Kapral
Автор S G Whittington
Автор C Desai
Дата выпуска 1986-06-21
dc.description The authors introduce a biased diffusion model of aggregation at a surface, which reduces to a ballistic model in one limit. They characterise the structure of the aggregates by a variety of properties and find that it is a strong function of the parameter governing the diffusion process. For thin films there is a crossover between a regime where there are several highly ramified pseudo-one-dimensional clusters and another regime where there is a single cluster which spans the lattice in both directions.
Формат application.pdf
Издатель Institute of Physics Publishing
Название Aggregation at a surface: crossover behaviour in a biased diffusion model
Тип paper
DOI 10.1088/0305-4470/19/9/043
Print ISSN 0305-4470
Журнал Journal of Physics A: Mathematical and General
Том 19
Первая страница 1727
Последняя страница 1734
Аффилиация R Kapral; Dept. of Chem., Toronto Univ., Ont., Canada
Аффилиация S G Whittington; Dept. of Chem., Toronto Univ., Ont., Canada
Аффилиация C Desai; Dept. of Chem., Toronto Univ., Ont., Canada
Выпуск 9

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