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Автор H W H M Jongbloets
Автор M J H van de Steeg
Автор J H M Stoelinga
Автор P Wyder
Дата выпуска 1980-04-20
dc.description A careful analysis has been made of the temperature dependence of the signal strength in a photoconductivity experiment in a semiconductor. The temperature dependence of the line intensity in a photothermal conductivity spectrum has been calculated. The results are in excellent agreement with measurements on high-purity germanium containing boron, aluminium and phosphorus as residual impurities ( approximately 10<sup>11</sup> atoms cm<sup>-3</sup>).
Формат application.pdf
Издатель Institute of Physics Publishing
Название Temperature dependence of the photothermal conductivity of semiconductors at low temperatures
Тип paper
DOI 10.1088/0022-3719/13/11/013
Print ISSN 0022-3719
Журнал Journal of Physics C: Solid State Physics
Том 13
Первая страница 2139
Последняя страница 2145
Аффилиация H W H M Jongbloets; Res. Inst. for Materials, Univ. of Nijmegen, Nijmegen, Netherlands
Аффилиация M J H van de Steeg; Res. Inst. for Materials, Univ. of Nijmegen, Nijmegen, Netherlands
Аффилиация J H M Stoelinga; Res. Inst. for Materials, Univ. of Nijmegen, Nijmegen, Netherlands
Аффилиация P Wyder; Res. Inst. for Materials, Univ. of Nijmegen, Nijmegen, Netherlands
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