Автор |
J - P Michenaud |
Автор |
J -P Issi |
Дата выпуска |
1972-10-31 |
dc.description |
Measurements of the low field galvanomagnetic tensor components of bismuth from 77 to 300K are reported. The eight magnetoresistivity coefficients A<sub>ij</sub> are found to vary as T<sup>-2</sup> up to nearly 120 K, then as T<sup>-3.9</sup> from 120 to 300 K. The electronic parameters are computed. The values of the electron ellipsoid tilt angle lie between 6 degrees 40' and 8 degrees 30' and the carrier density varies from 4.55*10<sup>17</sup> to 24.5*10<sup>17</sup> cm<sup>-3</sup> at 77 K and 300 K respectively. All mobilities except mu <sub>2</sub> vary as T<sup>-2</sup> in the lowest temperature range. |
Формат |
application.pdf |
Издатель |
Institute of Physics Publishing |
Название |
Electron and hole transport in bismuth |
Тип |
paper |
DOI |
10.1088/0022-3719/5/21/011 |
Print ISSN |
0022-3719 |
Журнал |
Journal of Physics C: Solid State Physics |
Том |
5 |
Первая страница |
3061 |
Последняя страница |
3072 |
Аффилиация |
J - P Michenaud; Univ. Catholique Louvain, Belgium |
Аффилиация |
J -P Issi; Univ. Catholique Louvain, Belgium |
Выпуск |
21 |