A transient thermal failure mode in metal film resistors
S V G Vardigans; D de Cogan; M Henini; S V G Vardigans; Metropolitan Coll. of Further Educ., Doncaster, UK; D de Cogan; Metropolitan Coll. of Further Educ., Doncaster, UK; M Henini; Metropolitan Coll. of Further Educ., Doncaster, UK
Журнал:
Journal of Physics D: Applied Physics
Дата:
1987-11-14
Аннотация:
A failure mode has been observed in metal film resistors when they are subjected to single shot high voltage pulses. The conductor fails at a high field point which may be inherent in the design or may be due to manufacturing defects. The localised nature of the failure leads to the conclusion that there is a closed loop mechanism: the decrease in thermal diffusivity of the structure with rising temperature leads to an increase in the rate of temperature rise.
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