| Автор | S V G Vardigans |
| Автор | D de Cogan |
| Автор | M Henini |
| Дата выпуска | 1987-11-14 |
| dc.description | A failure mode has been observed in metal film resistors when they are subjected to single shot high voltage pulses. The conductor fails at a high field point which may be inherent in the design or may be due to manufacturing defects. The localised nature of the failure leads to the conclusion that there is a closed loop mechanism: the decrease in thermal diffusivity of the structure with rising temperature leads to an increase in the rate of temperature rise. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | A transient thermal failure mode in metal film resistors |
| Тип | paper |
| DOI | 10.1088/0022-3727/20/11/014 |
| Electronic ISSN | 1361-6463 |
| Print ISSN | 0022-3727 |
| Журнал | Journal of Physics D: Applied Physics |
| Том | 20 |
| Первая страница | 1454 |
| Последняя страница | 1456 |
| Аффилиация | S V G Vardigans; Metropolitan Coll. of Further Educ., Doncaster, UK |
| Аффилиация | D de Cogan; Metropolitan Coll. of Further Educ., Doncaster, UK |
| Аффилиация | M Henini; Metropolitan Coll. of Further Educ., Doncaster, UK |
| Выпуск | 11 |
