| Автор | Ai Bui |
| Автор | K al Abdullah |
| Автор | A Loubiere |
| Автор | M Tao |
| Автор | Q C Nguyen |
| Дата выпуска | 1991-05-14 |
| dc.description | A new degradation analysis of ZnO-based varistors by AC impedance measurements is presented. From these measurements, which have been achieved on samples as a response to a small signal in the frequency range 10<sup>-3</sup> to 10<sup>5</sup> Hz, at room temperature, the distribution function of the relaxation time constant has been deduced. The heterogeneity factor beta characterizing the barriers constituting the ZnO-based varistors has been used as a measure of degradation. Our data reveal that the grain boundaries are not identical, in good agreement with the numerical/experimental current(I)-voltage(V) characteristics of various single-grain junctions. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | Impulse-degradation analysis of ZnO-based varistors by AC impedance measurements |
| Тип | paper |
| DOI | 10.1088/0022-3727/24/5/019 |
| Electronic ISSN | 1361-6463 |
| Print ISSN | 0022-3727 |
| Журнал | Journal of Physics D: Applied Physics |
| Том | 24 |
| Первая страница | 757 |
| Последняя страница | 762 |
| Аффилиация | Ai Bui; Lab. de Genie Electrique de Toulouse, Univ. Paul Sabatier, France |
| Аффилиация | K al Abdullah; Lab. de Genie Electrique de Toulouse, Univ. Paul Sabatier, France |
| Аффилиация | A Loubiere; Lab. de Genie Electrique de Toulouse, Univ. Paul Sabatier, France |
| Аффилиация | M Tao; Lab. de Genie Electrique de Toulouse, Univ. Paul Sabatier, France |
| Аффилиация | Q C Nguyen; Lab. de Genie Electrique de Toulouse, Univ. Paul Sabatier, France |
| Выпуск | 5 |
