| Автор | S I Zheludeva |
| Автор | M V Kovalchuk |
| Автор | N N Novikova |
| Автор | A N Sosphenov |
| Автор | V E Erochin |
| Автор | L A Feigin |
| Дата выпуска | 1993-04-14 |
| dc.description | The distribution of heavy ions inside a thin LB film and the structure perfection of organic layers have been studied by registering fluorescence excited by X-ray evanescent/standing wave fields under conditions of total external reflection. The possibility of the application of new complicated artificial multilayer systems as substrates for structure characterization of LB films deposited on them was revealed. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | X-ray total external reflection fluorescence study of LB films on solid substrate |
| Тип | paper |
| DOI | 10.1088/0022-3727/26/4A/042 |
| Electronic ISSN | 1361-6463 |
| Print ISSN | 0022-3727 |
| Журнал | Journal of Physics D: Applied Physics |
| Том | 26 |
| Первая страница | A202 |
| Последняя страница | A205 |
| Аффилиация | S I Zheludeva; A.V. Shubnikov Inst. of Crystallogr., Russian Acad. of Sci., Moscow, Russia |
| Аффилиация | M V Kovalchuk; A.V. Shubnikov Inst. of Crystallogr., Russian Acad. of Sci., Moscow, Russia |
| Аффилиация | N N Novikova; A.V. Shubnikov Inst. of Crystallogr., Russian Acad. of Sci., Moscow, Russia |
| Аффилиация | A N Sosphenov; A.V. Shubnikov Inst. of Crystallogr., Russian Acad. of Sci., Moscow, Russia |
| Аффилиация | V E Erochin; A.V. Shubnikov Inst. of Crystallogr., Russian Acad. of Sci., Moscow, Russia |
| Аффилиация | L A Feigin; A.V. Shubnikov Inst. of Crystallogr., Russian Acad. of Sci., Moscow, Russia |
| Выпуск | 4A |
