| Автор | S Stepanov |
| Автор | R Kohler |
| Дата выпуска | 1994-09-14 |
| dc.description | An approach is described to compute extremely asymmetric X-ray diffraction in multilayers and superlattices taking account of the normal lattice strain. This method is based on the dynamical theory of X-ray diffraction and on a matrix form of boundary conditions, thus providing a simple numerical solution to the problem. The developed approach can be used to interpret extremely asymmetric X-ray diffraction measurements of lattice strains in semiconductor multilayers and in other surface structures. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | A dynamical theory of extremely asymmetric X-ray diffraction taking account of normal lattice strain |
| Тип | paper |
| DOI | 10.1088/0022-3727/27/9/016 |
| Electronic ISSN | 1361-6463 |
| Print ISSN | 0022-3727 |
| Журнал | Journal of Physics D: Applied Physics |
| Том | 27 |
| Первая страница | 1922 |
| Последняя страница | 1928 |
| Аффилиация | S Stepanov; MPG-AG Rontgenbeugung, Berlin, Germany |
| Аффилиация | R Kohler; MPG-AG Rontgenbeugung, Berlin, Germany |
| Выпуск | 9 |
