The fractal structure in dislocation-free bicrystal silicon ribbon
Yan Cheng; Yan Cheng; Lab. 401, Gen. Res. Inst. for Non-Ferrous Metals, Beijing, China
Журнал:
Journal of Physics D: Applied Physics
Дата:
1994-09-14
Аннотация:
Sub-macroscopic fractal structure can be found by scanning electron microscopy and transmission electron microscopy on most areas of the surface of a dislocation-free bicrystal silicon ribbon grown by a special process using a micro-twin as a seed. The size of a single fractal cluster is several micrometres to several tens of micrometres, with a fractal dimension, D<sub>f</sub>, of about 1.64-1.84. The nature of the fractal structure changes with increasing thermodynamic driving force and gradually approaches that of snowflake-like figures. Preliminary theoretical analysis implies that the fractal structure should result from an inherent mechanism in bulk crystal growth and is not a surface phenomenon.
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