| Автор | Yan Cheng |
| Дата выпуска | 1994-09-14 |
| dc.description | Sub-macroscopic fractal structure can be found by scanning electron microscopy and transmission electron microscopy on most areas of the surface of a dislocation-free bicrystal silicon ribbon grown by a special process using a micro-twin as a seed. The size of a single fractal cluster is several micrometres to several tens of micrometres, with a fractal dimension, D<sub>f</sub>, of about 1.64-1.84. The nature of the fractal structure changes with increasing thermodynamic driving force and gradually approaches that of snowflake-like figures. Preliminary theoretical analysis implies that the fractal structure should result from an inherent mechanism in bulk crystal growth and is not a surface phenomenon. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | The fractal structure in dislocation-free bicrystal silicon ribbon |
| Тип | paper |
| DOI | 10.1088/0022-3727/27/9/019 |
| Electronic ISSN | 1361-6463 |
| Print ISSN | 0022-3727 |
| Журнал | Journal of Physics D: Applied Physics |
| Том | 27 |
| Первая страница | 1938 |
| Последняя страница | 1945 |
| Аффилиация | Yan Cheng; Lab. 401, Gen. Res. Inst. for Non-Ferrous Metals, Beijing, China |
| Выпуск | 9 |
