X-Y plotter capacitance meter interface for deep level spectroscopy
B Balland; J J Marchand; R Briot; G Grange; B Balland; Lab. de Phys. de la Matiere, Inst. Nat. des Sci. Appliquees de Lyon, Villeurbanne, France; J J Marchand; Lab. de Phys. de la Matiere, Inst. Nat. des Sci. Appliquees de Lyon, Villeurbanne, France; R Briot; Lab. de Phys. de la Matiere, Inst. Nat. des Sci. Appliquees de Lyon, Villeurbanne, France; G Grange; Lab. de Phys. de la Matiere, Inst. Nat. des Sci. Appliquees de Lyon, Villeurbanne, France
Журнал:
Journal of Physics E: Scientific Instruments
Дата:
1981-03-01
Аннотация:
Describes an interface device to be inserted into a capacitance spectroscopy characterisation system, between a commercial capacitance meter and a X-Y recorder. This interface samples its input signal using classical electronic components. These samples are processed giving an output proportional to C(t<sub>2</sub>)-C(t<sub>1</sub>), and whose amplitude varies when the temperature sweeps from 77K to 450K. The rate window extends from 10<sup>-1</sup> s<sup>-1</sup> to 10<sup>3</sup> s<sup>-1</sup>. The sensitivity for detecting the number of traps is about 1/1000 of the free carrier concentration.
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