| Автор | B Balland |
| Автор | J J Marchand |
| Автор | R Briot |
| Автор | G Grange |
| Дата выпуска | 1981-03-01 |
| dc.description | Describes an interface device to be inserted into a capacitance spectroscopy characterisation system, between a commercial capacitance meter and a X-Y recorder. This interface samples its input signal using classical electronic components. These samples are processed giving an output proportional to C(t<sub>2</sub>)-C(t<sub>1</sub>), and whose amplitude varies when the temperature sweeps from 77K to 450K. The rate window extends from 10<sup>-1</sup> s<sup>-1</sup> to 10<sup>3</sup> s<sup>-1</sup>. The sensitivity for detecting the number of traps is about 1/1000 of the free carrier concentration. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | X-Y plotter capacitance meter interface for deep level spectroscopy |
| Тип | paper |
| DOI | 10.1088/0022-3735/14/3/023 |
| Print ISSN | 0022-3735 |
| Журнал | Journal of Physics E: Scientific Instruments |
| Том | 14 |
| Первая страница | 367 |
| Последняя страница | 372 |
| Аффилиация | B Balland; Lab. de Phys. de la Matiere, Inst. Nat. des Sci. Appliquees de Lyon, Villeurbanne, France |
| Аффилиация | J J Marchand; Lab. de Phys. de la Matiere, Inst. Nat. des Sci. Appliquees de Lyon, Villeurbanne, France |
| Аффилиация | R Briot; Lab. de Phys. de la Matiere, Inst. Nat. des Sci. Appliquees de Lyon, Villeurbanne, France |
| Аффилиация | G Grange; Lab. de Phys. de la Matiere, Inst. Nat. des Sci. Appliquees de Lyon, Villeurbanne, France |
| Выпуск | 3 |
