Photocapacity analysis using a mercury probe
P R Jay; H C Wright; P R Jay; Plessey Res. (Caswell) Ltd., Towcester, UK; H C Wright; Plessey Res. (Caswell) Ltd., Towcester, UK
Журнал:
Journal of Physics E: Scientific Instruments
Дата:
1981-04-01
Аннотация:
A photocapacity technique for observing defect centres in semiconducting material is described. It is advantageous in not requiring the formation of a permanent diode junction in the semiconductor.
191.8Кб