A novel method for the determination of the thickness compliance of oriented polymer films
O O Akindayini; E L Nix; I M Ward; O O Akindayini; Thorn-EMI Central Res. Labs., Hayes, UK; E L Nix; Thorn-EMI Central Res. Labs., Hayes, UK; I M Ward; Thorn-EMI Central Res. Labs., Hayes, UK
Журнал:
Journal of Physics E: Scientific Instruments
Дата:
1986-11-01
Аннотация:
A new experimental method is described for the determination of the thickness compliance of thin polymer films. A combination of hydrostatic pressure and tensile stress is used to produce a tensile compressive stress normal to the film plane and the subsequent deformation is determined by a Hall effect device. Results are presented for voided and non-voided films of polyvinylidene fluoride.
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