| Автор | O O Akindayini |
| Автор | E L Nix |
| Автор | I M Ward |
| Дата выпуска | 1986-11-01 |
| dc.description | A new experimental method is described for the determination of the thickness compliance of thin polymer films. A combination of hydrostatic pressure and tensile stress is used to produce a tensile compressive stress normal to the film plane and the subsequent deformation is determined by a Hall effect device. Results are presented for voided and non-voided films of polyvinylidene fluoride. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | A novel method for the determination of the thickness compliance of oriented polymer films |
| Тип | paper |
| DOI | 10.1088/0022-3735/19/11/004 |
| Print ISSN | 0022-3735 |
| Журнал | Journal of Physics E: Scientific Instruments |
| Том | 19 |
| Первая страница | 911 |
| Последняя страница | 914 |
| Аффилиация | O O Akindayini; Thorn-EMI Central Res. Labs., Hayes, UK |
| Аффилиация | E L Nix; Thorn-EMI Central Res. Labs., Hayes, UK |
| Аффилиация | I M Ward; Thorn-EMI Central Res. Labs., Hayes, UK |
| Выпуск | 11 |
