A photoluminescence study of a series of closely related axial defects of monoclinic I and rhombic I symmetry in oxygen-rich, zinc-doped silicon
K G McGuigan; M O Henry; J D Campion; S E Daly; E McGlynn; M C Do Carmo
Журнал:
Semiconductor Science and Technology
Дата:
1996-06-01
Аннотация:
We report two new photoluminescence systems found in Czocralski silicon doped with zinc and annealed in the temperature range C. The zero-phonon transitions of these systems are observed at 1050.31(5) meV, 1051.24(5) meV and 1100.42(5) meV. Uniaxial stress perturbations applied to these transitions reveal that both centres possess monoclinic I symmetry with almost identical stress fit parameters. These parameters are remarkably similar to those recently reported for group II acceptor and oxygen-related complexes in silicon. Defect geometries and possible perturbation mechanisms are discussed.
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