Size modification of self-assembled InAs quantum dots by in situ etching
H Schuler; N Y Jin-Phillipp; F Phillipp; K Eberl
Журнал:
Semiconductor Science and Technology
Дата:
1998-11-01
Аннотация:
We report an in situ etching treatment of self-assembled InAs islands using in a molecular beam epitaxy system which allows reshaping and downsizing of the quantum dots with atomic layer precision. etching of a thin GaAs layer covering the InAs islands results in an array of 10 - 15 nm size holes on the surface due to enhanced etching at locally strained areas. The dots of a second InAs layer nucleate preferentially within the etched dips, which are vertically aligned with the underlying InAs dots. The photoluminescence linewidth is improved as compared to non-etched samples with equal spacer thickness.
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