Turn-on process in high voltage 4H-SiC thyristors
N V Dyakonova; M E Levinshtein; J W Palmour; S L Rumyantsev; R Singh
Журнал:
Semiconductor Science and Technology
Дата:
1998-02-01
Аннотация:
The turn-on process and steady state current-voltage characteristics have been investigated in 4H-SiC thyristors with a forward breakover voltage close to 700 V and pulse switch current density of . The current rise constant decreases monotonically with increasing temperature: ns at and ns at T = 500 K at high bias V. The value of ns is the lowest observed value for SiC thyristors. At very high current density the residual voltage drop on 4H-SiC thyristors is lower than on identically rated Si thyristors. The voltage drop decreases monotonically with increasing temperature.
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