The effect of band offset on the negative differential resistance characteristics of GaAs resonant tunnelling devices
M P Houng; Y H Wang; H C Wei; M P Houng; Dept. of Electr. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan; Y H Wang; Dept. of Electr. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan; H C Wei; Dept. of Electr. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan
Журнал:
Semiconductor Science and Technology
Дата:
1991-09-01
Аннотация:
AlGaAs/GaAs heterojunction resonant tunnelling bipolar transistors, with superlattice base, have been fabricated. For the single heterojunction structure an S-shaped NDR behaviour can be obtained when it is forward biased, due to the impact ionization enhancement in the AlGaAs/GaAs heterojunction. While it is reverse biased an N-shaped NDR behaviour comes after an insignificant S-shaped behaviour. It is believed to be the initiation of a resonant tunnelling process across the superlattice region. As for the double heterojunction structure, the I-V characteristic shows a bi-directional S-shaped switching behaviour. The different performance between the two structures can be modelled as the effect of the band offset of the heterojunction.
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