Asymmetry in the I(V) characteristics of a gated resonant tunnelling diode
M W Dellow; P H Beton; P C Main; T J Foster; L Eaves; A F Jezierski; W Kool; M Henini; S P Beaumont; C D W Wilkinson; M W Dellow; Dept. of Phys., Nottingham Univ., UK; P H Beton; Dept. of Phys., Nottingham Univ., UK; P C Main; Dept. of Phys., Nottingham Univ., UK; T J Foster; Dept. of Phys., Nottingham Univ., UK; L Eaves; Dept. of Phys., Nottingham Univ., UK; A F Jezierski; Dept. of Phys., Nottingham Univ., UK; W Kool; Dept. of Phys., Nottingham Univ., UK; M Henini; Dept. of Phys., Nottingham Univ., UK; S P Beaumont; Dept. of Phys., Nottingham Univ., UK; C D W Wilkinson; Dept. of Phys., Nottingham Univ., UK
Журнал:
Semiconductor Science and Technology
Дата:
1992-03-01
Аннотация:
The authors have investigated the I(V) characteristics of a GaAs/(AlGa)As resonant tunnelling diode in which the effective cross-sectional area, A, may be varied using a gate. As A is progressively reduced I(V) becomes asymmetric. In particular the peak to valley ratio in forward bias is decreased from a value approximately=20 to approximately=1, but in reverse bias remains constant at approximately=20. They propose that this arises from a lateral variation of the voltage drop across the tunnel barriers which leads to a smearing of the resonance. As A is reduced they also observe additional maxima and minima in I(V).
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