Optical characterization of pure ZnSe epilayers grown by metal organic vapour-phase epitaxy
A Chergui; J Valenta; J L Loison; M Robino; I Pelant; J B Grun; R Levy; O Briot; R L Aulombard; A Chergui; CNRS, Strasbourg, France; J Valenta; CNRS, Strasbourg, France; J L Loison; CNRS, Strasbourg, France; M Robino; CNRS, Strasbourg, France; I Pelant; CNRS, Strasbourg, France; J B Grun; CNRS, Strasbourg, France; R Levy; CNRS, Strasbourg, France; O Briot; CNRS, Strasbourg, France; R L Aulombard; CNRS, Strasbourg, France
Журнал:
Semiconductor Science and Technology
Дата:
1994-11-02
Аннотация:
Different ZnSe/GaAs epilayers prepared by low-pressure metal organic vapour-phase epitaxy under the conditions given by Nurmikko and Gunshor (1993 Physica B 185 16) are studied through their low-temperature transmission, reflection and photoluminescence spectra. Several samples are etched out from their GaAs substrate and the properties of as-grown surfaces and etched surfaces are compared. The etched samples seem to be free of in-plane strain and to behave like bulk ZnSe. The free-exciton excited state (n=2) is clearly observed in transmission, reflection and luminescence spectra. We also studied the thermal quenching of the photoluminescence in order to confirm the origin of some bound-exciton centres.
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