X-ray induced conduction in n-hexane at low stress
P E Secker; T J Lewis; P E Secker; Materials Laboratory, Queen Mary College, University of London; T J Lewis; Materials Laboratory, Queen Mary College, University of London
Журнал:
British Journal of Applied Physics
Дата:
1965-11-01
Аннотация:
By means of a new technique for injecting charge into a dielectric liquid, conduction current and mobility values have been measured in n-hexane for stresses over the range 0-7 kv cm<sup>-1</sup>. At low stress (<1 kv cm<sup>-1</sup>) the induced conduction current is shown to be space-charge-limited, but for higher stress values, the x-ray dose rate principally determines the magnitude of the current. The values obtained for both positive and negative ion mobility are considerably greater than those reported previously; it is postulated that this result arose as a result of current-induced motion of the liquid.
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