| Автор | P E Secker |
| Автор | T J Lewis |
| Дата выпуска | 1965-11-01 |
| dc.description | By means of a new technique for injecting charge into a dielectric liquid, conduction current and mobility values have been measured in n-hexane for stresses over the range 0-7 kv cm<sup>-1</sup>. At low stress (<1 kv cm<sup>-1</sup>) the induced conduction current is shown to be space-charge-limited, but for higher stress values, the x-ray dose rate principally determines the magnitude of the current. The values obtained for both positive and negative ion mobility are considerably greater than those reported previously; it is postulated that this result arose as a result of current-induced motion of the liquid. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | X-ray induced conduction in n-hexane at low stress |
| Тип | paper |
| DOI | 10.1088/0508-3443/16/11/305 |
| Print ISSN | 0508-3443 |
| Журнал | British Journal of Applied Physics |
| Том | 16 |
| Первая страница | 1649 |
| Последняя страница | 1656 |
| Аффилиация | P E Secker; Materials Laboratory, Queen Mary College, University of London |
| Аффилиация | T J Lewis; Materials Laboratory, Queen Mary College, University of London |
| Выпуск | 11 |
