Wafering of bulk specimens for transmission electron microscopy
B Mastel; H E Kissinger; B Mastel; General Electric Company, Hanford Atomic Products Operation Richland, Washington, U.S.A; H E Kissinger; General Electric Company, Hanford Atomic Products Operation Richland, Washington, U.S.A
Журнал:
Journal of Scientific Instruments
Дата:
1964-08-01
Аннотация:
A simple technique for preparing wafers with plane parallel sides from bulk specimens is described. Evidence is presented that the worked layer introduced by the wafering action is removed during subsequent chemical or electrolytic thinning required for transmission electron microscopy.
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