| Автор | B Mastel |
| Автор | H E Kissinger |
| Дата выпуска | 1964-08-01 |
| dc.description | A simple technique for preparing wafers with plane parallel sides from bulk specimens is described. Evidence is presented that the worked layer introduced by the wafering action is removed during subsequent chemical or electrolytic thinning required for transmission electron microscopy. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | Wafering of bulk specimens for transmission electron microscopy |
| Тип | note |
| DOI | 10.1088/0950-7671/41/8/410 |
| Print ISSN | 0950-7671 |
| Журнал | Journal of Scientific Instruments |
| Том | 41 |
| Первая страница | 510 |
| Последняя страница | 511 |
| Аффилиация | B Mastel; General Electric Company, Hanford Atomic Products Operation Richland, Washington, U.S.A |
| Аффилиация | H E Kissinger; General Electric Company, Hanford Atomic Products Operation Richland, Washington, U.S.A |
| Выпуск | 8 |
