Preparation of contamination-free tungsten specimens for the field-ion microscope
J E Fasth; B Loberg; H Nordén; J E Fasth; Department of Physics, Chalmers University of Technology, Gothenburg, Sweden; B Loberg; Department of Physics, Chalmers University of Technology, Gothenburg, Sweden; H Nordén; Department of Physics, Chalmers University of Technology, Gothenburg, Sweden
Журнал:
Journal of Scientific Instruments
Дата:
1967-12-01
Аннотация:
A recently developed technique for viewing wire specimens in the electron microscope has been used in a search for a suitable electrolyte for preparation of tungsten specimens for the field-ion microscope. Clean specimens which yield good transmission electron micrographs can be produced and the amount of back-polishing can be monitored with an electronic timer.
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