| Автор | J E Fasth |
| Автор | B Loberg |
| Автор | H Nordén |
| Дата выпуска | 1967-12-01 |
| dc.description | A recently developed technique for viewing wire specimens in the electron microscope has been used in a search for a suitable electrolyte for preparation of tungsten specimens for the field-ion microscope. Clean specimens which yield good transmission electron micrographs can be produced and the amount of back-polishing can be monitored with an electronic timer. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | Preparation of contamination-free tungsten specimens for the field-ion microscope |
| Тип | note |
| DOI | 10.1088/0950-7671/44/12/428 |
| Print ISSN | 0950-7671 |
| Журнал | Journal of Scientific Instruments |
| Том | 44 |
| Первая страница | 1044 |
| Последняя страница | 1045 |
| Аффилиация | J E Fasth; Department of Physics, Chalmers University of Technology, Gothenburg, Sweden |
| Аффилиация | B Loberg; Department of Physics, Chalmers University of Technology, Gothenburg, Sweden |
| Аффилиация | H Nordén; Department of Physics, Chalmers University of Technology, Gothenburg, Sweden |
| Выпуск | 12 |
