Comparison of the effect of processing parameters and degradation on the DC and microwave properties of thin films and polycrystalline bulk high-T<sub>c</sub> superconducting materials
R Pragasam; C Srinivasan; V R K Murthy; B Viswanathan; J Sobhanadri; K M Satyalakshmi; M S Hegde; R Pragasam; Indian Inst. of Sci., Bangalore, India; C Srinivasan; Indian Inst. of Sci., Bangalore, India; V R K Murthy; Indian Inst. of Sci., Bangalore, India; B Viswanathan; Indian Inst. of Sci., Bangalore, India; J Sobhanadri; Indian Inst. of Sci., Bangalore, India; K M Satyalakshmi; Indian Inst. of Sci., Bangalore, India; M S Hegde; Indian Inst. of Sci., Bangalore, India
Журнал:
Superconductor Science and Technology
Дата:
1993-06-01
Аннотация:
The sharp increase in microwave power loss (the reverse of what has previously been reported) at the transition temperature in high-T<sub>c</sub> superconducting systems such as YBaCu oxide (polycrystalline bulk and thin films obtained by the laser ablation technique) and BiPbSrCaCu oxide is reported. The differences between DC resistivity ( rho ) and the microwave power loss (related to microwave surface resistance) are analysed from the data obtained by a simultaneous measurement set-up. The influence of various parameters, such as preparation conditions, thickness and aging of the sample and the probing frequency (6-18 GHz), on the variation of microwave power loss with temperature is outlined.
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