| Автор | R Pragasam |
| Автор | C Srinivasan |
| Автор | V R K Murthy |
| Автор | B Viswanathan |
| Автор | J Sobhanadri |
| Автор | K M Satyalakshmi |
| Автор | M S Hegde |
| Дата выпуска | 1993-06-01 |
| dc.description | The sharp increase in microwave power loss (the reverse of what has previously been reported) at the transition temperature in high-T<sub>c</sub> superconducting systems such as YBaCu oxide (polycrystalline bulk and thin films obtained by the laser ablation technique) and BiPbSrCaCu oxide is reported. The differences between DC resistivity ( rho ) and the microwave power loss (related to microwave surface resistance) are analysed from the data obtained by a simultaneous measurement set-up. The influence of various parameters, such as preparation conditions, thickness and aging of the sample and the probing frequency (6-18 GHz), on the variation of microwave power loss with temperature is outlined. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | Comparison of the effect of processing parameters and degradation on the DC and microwave properties of thin films and polycrystalline bulk high-T<sub>c</sub> superconducting materials |
| Тип | paper |
| DOI | 10.1088/0953-2048/6/6/003 |
| Electronic ISSN | 1361-6668 |
| Print ISSN | 0953-2048 |
| Журнал | Superconductor Science and Technology |
| Том | 6 |
| Первая страница | 402 |
| Последняя страница | 407 |
| Аффилиация | R Pragasam; Indian Inst. of Sci., Bangalore, India |
| Аффилиация | C Srinivasan; Indian Inst. of Sci., Bangalore, India |
| Аффилиация | V R K Murthy; Indian Inst. of Sci., Bangalore, India |
| Аффилиация | B Viswanathan; Indian Inst. of Sci., Bangalore, India |
| Аффилиация | J Sobhanadri; Indian Inst. of Sci., Bangalore, India |
| Аффилиация | K M Satyalakshmi; Indian Inst. of Sci., Bangalore, India |
| Аффилиация | M S Hegde; Indian Inst. of Sci., Bangalore, India |
| Выпуск | 6 |
