High-temperature superconductor thin-film characterization by the modulated optical reflectance technique
D P Almond; A K Barker; A C Bento; S K Singh; N J Appleyard; T J Jackson; S B Palmer; D P Almond; Sch. of Mater. Sci., Bath Univ., UK; A K Barker; Sch. of Mater. Sci., Bath Univ., UK; A C Bento; Sch. of Mater. Sci., Bath Univ., UK; S K Singh; Sch. of Mater. Sci., Bath Univ., UK; N J Appleyard; Sch. of Mater. Sci., Bath Univ., UK; T J Jackson; Sch. of Mater. Sci., Bath Univ., UK; S B Palmer; Sch. of Mater. Sci., Bath Univ., UK
Журнал:
Superconductor Science and Technology
Дата:
1995-08-01
Аннотация:
Measurements are presented of the modulated optical reflectance (MOR) of laser-ablated thin films of YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7-x</sub> having a range of electrical characteristics. It is found that the room-temperature MOR signal provides a good indication of film quality. There is a strong correlation between MOR signal amplitude and a film's normal- and superconducting-state characteristics. The origins of the MOR signal are discussed and it is suggested that it is directly dependent on the characteristic linear temperature dependence of carrier concentration found in high-temperature superconductors. The potential of MOR for superconducting thin-film device inspection is noted.
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