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Автор D P Almond
Автор A K Barker
Автор A C Bento
Автор S K Singh
Автор N J Appleyard
Автор T J Jackson
Автор S B Palmer
Дата выпуска 1995-08-01
dc.description Measurements are presented of the modulated optical reflectance (MOR) of laser-ablated thin films of YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7-x</sub> having a range of electrical characteristics. It is found that the room-temperature MOR signal provides a good indication of film quality. There is a strong correlation between MOR signal amplitude and a film's normal- and superconducting-state characteristics. The origins of the MOR signal are discussed and it is suggested that it is directly dependent on the characteristic linear temperature dependence of carrier concentration found in high-temperature superconductors. The potential of MOR for superconducting thin-film device inspection is noted.
Формат application.pdf
Издатель Institute of Physics Publishing
Название High-temperature superconductor thin-film characterization by the modulated optical reflectance technique
Тип paper
DOI 10.1088/0953-2048/8/8/011
Electronic ISSN 1361-6668
Print ISSN 0953-2048
Журнал Superconductor Science and Technology
Том 8
Первая страница 667
Последняя страница 672
Аффилиация D P Almond; Sch. of Mater. Sci., Bath Univ., UK
Аффилиация A K Barker; Sch. of Mater. Sci., Bath Univ., UK
Аффилиация A C Bento; Sch. of Mater. Sci., Bath Univ., UK
Аффилиация S K Singh; Sch. of Mater. Sci., Bath Univ., UK
Аффилиация N J Appleyard; Sch. of Mater. Sci., Bath Univ., UK
Аффилиация T J Jackson; Sch. of Mater. Sci., Bath Univ., UK
Аффилиация S B Palmer; Sch. of Mater. Sci., Bath Univ., UK
Выпуск 8

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